Novel gas-doping technique for local spectroscopic measurements in pulsed-power systems
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چکیده
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Many devices, particularly power devices, are not designed to operate continuously or with CW signals. This is especially true when devices are being tested on-wafer, where the thermal resistance is greatly increased [1]. In these cases, S-parameter measurements are best performed in a pulsed test environment. The details of pulsed measurement are greatly dependent on the pulse properties being...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 1998
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1148791